더 스마트한 테스트 전략: 디바이스가 점점 더 스마트해지면서 반도체 테스트 솔루션도 점점 더 스마트해집니다.
NI가 실험실에서 생산 현장까지 확장 가능한 비용 효율적인 소프트웨어와 솔루션을 어떻게 제공하는지 알아보십시오.
As devices get smarter, so do our semiconductor test solutions. We know that semiconductor technology requirements outpace traditional test coverage approaches. That’s why we prioritize investments in software and systems that help you build solutions that meet your evolving needs at every step of the process.
NI’s RF front-end validation reference architecture simplifies wideband RF power amplifier (PA) validation workflows for demanding applications such as 5G and Wi-Fi 6. The RF front-end validation reference architecture includes powerful new benefits:
NI’s wafer-level reliability (WLR) solutions provide a scalable, flexible, and future-proof software and hardware architecture with which you can optimize how you would gather the data required to execute your device or process qualification efforts. Through our parallelism, source measure unit (SMU) density, and performance, we can provide throughput improvements and help you gather more insights and statistics in the same amount of time, or provide you with the same amount of data in less time: